FLEXIBLE SOFTWARE RELIABILITY GROWTH MODELS

P.K. Kapur, A. Gupta, V.S.S. Yadavalli, S.J. Claasen

Abstract


ENGLISH ABSTRACT: Numerous Software Reliability Growth Models (SRGMs) have been discussed in the literature. These models are used to predict fault content and reliability of software. It has been observed that the relationship between testing time and the corresponding number of faults removed is either exponential or S-shaped, or a mix of the two. Another important class of SRGMs, known as flexible SRGMs, can depict both exponential and S-shaped growth curves. The paper introduces a new concept of power logistic learning function that proves to be very flexible, in the sense that it represents various curve types exponential, Rayleigh, Weibull or simple logistic. The flexible nature of the power logistic function gives the flexible SRGM a higher degree of accuracy and wider applicability.

AFRIKAANSE OPSOMMING: Verskeie voorbeelde van Betroubaarheidsgroeimodelle vir programmatuur word in die literatuur beskryf. Die modelle word gebruik vir die voorspelling van foutinhoud en programmatuurbetroubaarheid. Daar word waargeneem dat die verband tussen toetstyd en die resulterende foutverwydering eksponensiaal of S-vormig of n kombinasie daarvan is. Aanpasbare modelle insluitende diskrete ekwivalente word ook behandel. Die publikasie ontleed vervolgens algemene plooibare maglogistieke leerkromme met wye toepasbaarheid wat slaan op eksponensie, Rayleigh-, Weilbull- en logistieke funksies. Die plooibaarheid van die model waarborg akkuraatheid en wye toepasbaarheid met die verlangde gehalte van voorspelbaarheid.


Full Text:

PDF


DOI: https://doi.org/10.7166/17-2-147

Refbacks

  • There are currently no refbacks.




Copyright (c) 2015 The South African Journal of Industrial Engineering


ISSN 2224-7890 (on-line) ; ISSN 1012-277X (print)


Powered by OJS and hosted by Stellenbosch University Library and Information Service since 2011.


Disclaimer:

This journal is hosted by the SU LIS on request of the journal owner/editor. The SU LIS takes no responsibility for the content published within this journal, and disclaim all liability arising out of the use of or inability to use the information contained herein. We assume no responsibility, and shall not be liable for any breaches of agreement with other publishers/hosts.

SUNJournals Help