1.
van Wyk A, van Vuuren JH. A MACHINE LEARNING FRAMEWORK FOR DATA-DRIVEN DEFECT DETECTION IN MULTISTAGE MANUFACTURING SYSTEMS. S AFR J IND ENG [Internet]. 2024Aug.30 [cited 2024Oct.7];35(2):154-70. Available from: https://sajie.journals.ac.za/pub/article/view/3008