van Wyk, Ansuné, and J H van Vuuren. “A MACHINE LEARNING FRAMEWORK FOR DATA-DRIVEN DEFECT DETECTION IN MULTISTAGE MANUFACTURING SYSTEMS”. The South African Journal of Industrial Engineering 35, no. 2 (August 30, 2024): 154–170. Accessed November 21, 2024. https://sajie.journals.ac.za/pub/article/view/3008.