Wang, Chien-Chih, and Bing-De Wu. “CLASSIFICATION AND PREDICTION OF WAFER PROBE YIELD IN DRAM MANUFACTURING USING MAHALANOBIS-TAGUCHI SYSTEM AND NEURAL NETWORK”. The South African Journal of Industrial Engineering 30, no. 1 (May 29, 2019): 248–256. Accessed November 21, 2024. https://sajie.journals.ac.za/pub/article/view/1627.