VAN WYK, A.; VAN VUUREN, J. H. . A MACHINE LEARNING FRAMEWORK FOR DATA-DRIVEN DEFECT DETECTION IN MULTISTAGE MANUFACTURING SYSTEMS. The South African Journal of Industrial Engineering, [S. l.], v. 35, n. 2, p. 154–170, 2024. DOI: 10.7166/35-2-3008. Disponível em: https://sajie.journals.ac.za/pub/article/view/3008. Acesso em: 7 oct. 2024.