FAN, P.-H. APPLYING SIX SIGMA TO IMPROVE THE DEFECT RATE OF ELECTRONIC COMPONENTS: A SIX SIGMA CASE STUDY. The South African Journal of Industrial Engineering, [S. l.], v. 35, n. 1, p. 41–56, 2024. DOI: 10.7166/35-1-2899. Disponível em: https://sajie.journals.ac.za/pub/article/view/2899. Acesso em: 21 nov. 2024.