WANG, C.-C.; WU, B.-D. CLASSIFICATION AND PREDICTION OF WAFER PROBE YIELD IN DRAM MANUFACTURING USING MAHALANOBIS-TAGUCHI SYSTEM AND NEURAL NETWORK. The South African Journal of Industrial Engineering, [S. l.], v. 30, n. 1, p. 248–256, 2019. DOI: 10.7166/30-1-1627. Disponível em: https://sajie.journals.ac.za/pub/article/view/1627. Acesso em: 21 nov. 2024.