TEOH, W. L.; FUN, M. S.; TEH, S. Y.; KHOO, M. B. C.; YEONG, W. C. EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X-BAR CHART WITH ESTIMATED PROCESS PARAMETERS. The South African Journal of Industrial Engineering, [S. l.], v. 27, n. 1, p. 20–31, 2016. DOI: 10.7166/27-1-978. Disponível em: http://sajie.journals.ac.za/pub/article/view/978. Acesso em: 28 apr. 2024.